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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 8 — Apr. 12, 2010
  • pp: 8528–8539

Rigorous modal analysis of silicon strip nanoscale waveguides

D. M. H. Leung, N. Kejalakshmy, B. M. A. Rahman, and K. T. V. Grattan  »View Author Affiliations


Optics Express, Vol. 18, Issue 8, pp. 8528-8539 (2010)
http://dx.doi.org/10.1364/OE.18.008528


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Abstract

A full-vectorial H-field Finite Element Method has been used for the rigorous modal analysis of silicon strip waveguides. The spatial variation of the full-vectorial H and E-fields are also discussed in details and further, the Poynting vector is also presented. The modal area, hybridness, single mode operation and birefringence are also described for such silicon strip waveguides.

© 2010 OSA

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(040.6040) Detectors : Silicon
(230.7370) Optical devices : Waveguides
(350.4238) Other areas of optics : Nanophotonics and photonic crystals

ToC Category:
Physical Optics

History
Original Manuscript: December 24, 2009
Revised Manuscript: March 11, 2010
Manuscript Accepted: March 28, 2010
Published: April 8, 2010

Citation
D. M. H. Leung, N. Kejalakshmy, B. M. A. Rahman, and K. T. V. Grattan, "Rigorous modal analysis of silicon strip nanoscale waveguides," Opt. Express 18, 8528-8539 (2010)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-8-8528


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References

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