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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 18, Iss. 9 — Apr. 26, 2010
  • pp: 9684–9689

Superfast phase-shifting method for 3-D shape measurement

Song Zhang, Daniel Van Der Weide, and James Oliver  »View Author Affiliations

Optics Express, Vol. 18, Issue 9, pp. 9684-9689 (2010)

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Recently introduced DLP Discovery technology allows for tens of kHz binary image switching, which has great potential for superfast 3-D shape measurement. This paper presents a system that realizes 3-D shape measurement by using a DLP Discovery technology to switch binary structured patterns at very high frame rates. The sinusoidal fringe patterns are generated by properly defocusing the projector. Combining this approach with a phase-shifting method, we achieve an unprecedented rate for 3-D shape measurement: 667 Hz. This technology can be applied to numerous applications including medical science, biometrics, and entertainment.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Imaging Systems

Original Manuscript: March 12, 2010
Revised Manuscript: April 21, 2010
Manuscript Accepted: April 22, 2010
Published: April 23, 2010

Virtual Issues
Vol. 5, Iss. 9 Virtual Journal for Biomedical Optics

Song Zhang, Daniel Van Der Weide, and James Oliver, "Superfast phase-shifting method for 3-D shape measurement," Opt. Express 18, 9684-9689 (2010)

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