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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 1 — Jan. 3, 2011
  • pp: 141–146

Terahertz imaging and spectroscopy of large-area single-layer graphene

J. L. Tomaino, A. D. Jameson, J. W. Kevek, M. J. Paul, A. M. van der Zande, R. A. Barton, P. L. McEuen, E. D. Minot, and Yun-Shik Lee  »View Author Affiliations


Optics Express, Vol. 19, Issue 1, pp. 141-146 (2011)
http://dx.doi.org/10.1364/OE.19.000141


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Abstract

We demonstrate terahertz (THz) imaging and spectroscopy of a 15 × 15-mm2 single-layer graphene film on Si using broadband THz pulses. The THz images clearly map out the THz carrier dynamics of the graphene-on-Si sample, allowing us to measure sheet conductivity with sub-mm resolution without fabricating electrodes. The THz carrier dynamics are dominated by intraband transitions and the THz-induced electron motion is characterized by a flat spectral response. A theoretical analysis based on the Fresnel coefficients for a metallic thin film shows that the local sheet conductivity varies across the sample from σs = 1.7 × 10−3 to 2.4 × 10−3 Ω−1 (sheet resistance, ρs = 420 - 590 Ω/sq).

© 2011 OSA

OCIS Codes
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors
(160.4236) Materials : Nanomaterials
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Spectroscopy

History
Original Manuscript: November 10, 2010
Revised Manuscript: December 14, 2010
Manuscript Accepted: December 15, 2010
Published: December 21, 2010

Citation
J. L. Tomaino, A. D. Jameson, J. W. Kevek, M. J. Paul, A. M. van der Zande, R. A. Barton, P. L. McEuen, E. D. Minot, and Yun-Shik Lee, "Terahertz imaging and spectroscopy of large-area single-layer graphene," Opt. Express 19, 141-146 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-1-141


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