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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 13 — Jun. 20, 2011
  • pp: 12635–12645

Comparison of photodiode nonlinearity measurement systems

Meredith N. Draa, Alexander S. Hastings, and Keith J. Williams  »View Author Affiliations


Optics Express, Vol. 19, Issue 13, pp. 12635-12645 (2011)
http://dx.doi.org/10.1364/OE.19.012635


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Abstract

Photodiode nonlinearity measurements using one-, two- and three-tone measurement systems are compared with each other, to investigate the comparison accuracy between setups. The mathematical relationship between each setup is analyzed, and data on multiple devices are compared to find under which conditions the measurements are comparable. It is shown that the three measurement systems can be used interchangeably only when the distortion adheres to the expected mathematical slopes.

© 2011 OSA

OCIS Codes
(230.5170) Optical devices : Photodiodes

ToC Category:
Optical Devices

History
Original Manuscript: March 28, 2011
Revised Manuscript: May 13, 2011
Manuscript Accepted: May 16, 2011
Published: June 15, 2011

Citation
Meredith N. Draa, Alexander S. Hastings, and Keith J. Williams, "Comparison of photodiode nonlinearity measurement systems," Opt. Express 19, 12635-12645 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-13-12635


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References

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