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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 17 — Aug. 15, 2011
  • pp: 16550–16559

X-ray wavefront characterization using a rotating shearing interferometer technique

Hongchang Wang, Kawal Sawhney, Sébastien Berujon, Eric Ziegler, Simon Rutishauser, and Christian David  »View Author Affiliations

Optics Express, Vol. 19, Issue 17, pp. 16550-16559 (2011)

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A fast and accurate method to characterize the X-ray wavefront by rotating one of the two gratings of an X-ray shearing interferometer is described and investigated step by step. Such a shearing interferometer consists of a phase grating mounted on a rotation stage, and an absorption grating used as a transmission mask. The mathematical relations for X-ray Moiré fringe analysis when using this device are derived and discussed in the context of the previous literature assumptions. X-ray beam wavefronts without and after X-ray reflective optical elements have been characterized at beamline B16 at Diamond Light Source (DLS) using the presented X-ray rotating shearing interferometer (RSI) technique. It has been demonstrated that this improved method allows accurate calculation of the wavefront radius of curvature and the wavefront distortion, even when one has no previous information on the grating projection pattern period, magnification ratio and the initial grating orientation. As the RSI technique does not require any a priori knowledge of the beam features, it is suitable for routine characterization of wavefronts of a wide range of radii of curvature.

© 2011 OSA

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
X-ray Optics

Original Manuscript: June 17, 2011
Revised Manuscript: July 25, 2011
Manuscript Accepted: August 10, 2011
Published: August 12, 2011

Hongchang Wang, Kawal Sawhney, Sébastien Berujon, Eric Ziegler, Simon Rutishauser, and Christian David, "X-ray wavefront characterization using a rotating shearing interferometer technique," Opt. Express 19, 16550-16559 (2011)

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