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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 18 — Aug. 29, 2011
  • pp: 17750–17757

Discontinuity induced angular distribution of photon plasmon coupling

D. Brissinger, A. L. Lereu, L. Salomon, T. Charvolin, B. Cluzel, C. Dumas, A. Passian, and F. de Fornel  »View Author Affiliations


Optics Express, Vol. 19, Issue 18, pp. 17750-17757 (2011)
http://dx.doi.org/10.1364/OE.19.017750


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Abstract

Metal-dielectric transitions are important structures that can display a host of optical characteristics including excitation of plasmons. Metal-dielectric discontinuities can furthermore support plasmon excitation without a severe condition on the incident angle of the exciting photons. Using a semi-infinite thin gold film, we study surface plasmon (SP) excitation and the associated electromagnetic near-field distribution by recording the resulting plasmon interference patterns. In particular, we measure interference periods involving SPs at the scanable metal/air interface and the buried metal/glass one. Supported by optical near-field simulations and experiments, we demonstrate that the metal/glass surface plasmon is observable over a wide range of incident angles encompassing values above and below the critical incident angle. As a result, it is shown that scanning near-field microscopy can provide quantitative evaluation of the real part of the buried surface plasmon wavevector.

© 2011 OSA

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(240.6680) Optics at surfaces : Surface plasmons
(310.0310) Thin films : Thin films
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Optics at Surfaces

History
Original Manuscript: May 31, 2011
Revised Manuscript: July 13, 2011
Manuscript Accepted: July 13, 2011
Published: August 25, 2011

Citation
D. Brissinger, A. L. Lereu, L. Salomon, T. Charvolin, B. Cluzel, C. Dumas, A. Passian, and F. de Fornel, "Discontinuity induced angular distribution of photon plasmon coupling," Opt. Express 19, 17750-17757 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-18-17750


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