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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 21 — Oct. 10, 2011
  • pp: 20673–20680

Surface-plasmon mediated total absorption of light into silicon

Jae Woong Yoon, Woo Jae Park, Kyu Jin Lee, Seok Ho Song, and Robert Magnusson  »View Author Affiliations

Optics Express, Vol. 19, Issue 21, pp. 20673-20680 (2011)

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We report surface-plasmon mediated total absorption of light into a silicon substrate. For an Au grating on Si, we experimentally show that a surface-plasmon polariton (SPP) excited on the air/Au interface leads to total absorption with a rate nearly 10 times larger than the ohmic damping rate of collectively oscillating free electrons in the Au film. Rigorous numerical simulations show that the SPP resonantly enhances forward diffraction of light to multiple orders of lossy waves in the Si substrate with reflection and ohmic absorption in the Au film being negligible. The measured reflection and phase spectra reveal a quantitative relation between the peak absorbance and the associated reflection phase change, implying a resonant interference contribution to this effect. An analytic model of a dissipative quasi-bound resonator provides a general formula for the resonant absorbance-phase relation in excellent agreement with the experimental results.

© 2011 OSA

OCIS Codes
(040.6040) Detectors : Silicon
(050.1950) Diffraction and gratings : Diffraction gratings
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Optics at Surfaces

Original Manuscript: August 24, 2011
Revised Manuscript: September 21, 2011
Manuscript Accepted: September 22, 2011
Published: October 3, 2011

Jae Woong Yoon, Woo Jae Park, Kyu Jin Lee, Seok Ho Song, and Robert Magnusson, "Surface-plasmon mediated total absorption of light into silicon," Opt. Express 19, 20673-20680 (2011)

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