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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 25 — Dec. 5, 2011
  • pp: 25355–25366

Accuracy measurements and improvement for complete characterization of optical pulses from nonlinear processes via multiple spectral-shearing interferometry

Adam S. Wyatt, Alexander Grün, Philip K. Bates, Olivier Chalus, Jens Biegert, and Ian A. Walmsley  »View Author Affiliations


Optics Express, Vol. 19, Issue 25, pp. 25355-25366 (2011)
http://dx.doi.org/10.1364/OE.19.025355


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Abstract

We demonstrate that multiple spectral-shearing interferometry increases the precision and accuracy of measurements of the spectral phase of a complex pulse (time-bandwidth product = 125) arising from self-phase modulation in a gas filled capillary. We verify that the measured interferometric phase is accurate to 0.1 rad across the full bandwidth by checking the consistency between the spectral phases of each individual shear measurement. The accuracy of extracting pulse parameters (group delay dispersion, pulse duration and peak intensity) for single shear measurements were verified to better than 10% by comparison with the multishear reconstruction. High order space-time coupling is quantified across a single transverse dimension, verifying the suitability of such pulses for use in strong field experiments.

© 2011 OSA

OCIS Codes
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.0320) Ultrafast optics : Ultrafast optics
(320.5520) Ultrafast optics : Pulse compression
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: October 19, 2011
Revised Manuscript: November 13, 2011
Manuscript Accepted: November 14, 2011
Published: November 28, 2011

Citation
Adam S. Wyatt, Alexander Grün, Philip K. Bates, Olivier Chalus, Jens Biegert, and Ian A. Walmsley, "Accuracy measurements and improvement for complete characterization of optical pulses from nonlinear processes via multiple spectral-shearing interferometry," Opt. Express 19, 25355-25366 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-25-25355


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