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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 27 — Dec. 19, 2011
  • pp: 26651–26659

Sensitive voltage interrogation method using electro-optically tunable SPR sensors

Zhiyou Wang, Zheng Zheng, Kun Wang, Yalin Su, Lei Liu, Lusheng Song, Yusheng Bian, Rui Hou, Shaopeng Li, and Jinsong Zhu  »View Author Affiliations

Optics Express, Vol. 19, Issue 27, pp. 26651-26659 (2011)

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A novel voltage interrogation method using electro-optically tunable waveguide-coupled surface plasmon resonance sensors is demonstrated. Before measurements, we use a bicell photodetector to detect the reflectance from the sensor and take the differential signal from the photodetector as the resonance condition. For different analytes, by scanning the DC voltage on the waveguide layer of the sensor chip, the resonance condition can be maintained the same. Under this condition, we record the values of this voltage, namely the resonant voltage. Theoretical calculations and experimental results show the resonant voltage has a highly linear and sensitive response to analyte’s refractive index. This method is simple in configuration, and complicated signal processing algorithms can be avoided.

© 2011 OSA

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(280.4788) Remote sensing and sensors : Optical sensing and sensors

ToC Category:

Original Manuscript: October 10, 2011
Revised Manuscript: November 19, 2011
Manuscript Accepted: November 27, 2011
Published: December 14, 2011

Virtual Issues
Vol. 7, Iss. 2 Virtual Journal for Biomedical Optics

Zhiyou Wang, Zheng Zheng, Kun Wang, Yalin Su, Lei Liu, Lusheng Song, Yusheng Bian, Rui Hou, Shaopeng Li, and Jinsong Zhu, "Sensitive voltage interrogation method using electro-optically tunable SPR sensors," Opt. Express 19, 26651-26659 (2011)

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