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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 5 — Feb. 28, 2011
  • pp: 4199–4209

BRDF profile of Tyvek and its implementation in the Geant4 simulation toolkit

Libor Nozka, Miroslav Pech, Helena Hiklova, Dusan Mandat, Miroslav Hrabovsky, Petr Schovanek, and Miroslav Palatka  »View Author Affiliations

Optics Express, Vol. 19, Issue 5, pp. 4199-4209 (2011)

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Diffuse and specular characteristics of the Tyvek 1025-BL material are reported with respect to their implementation in the Geant4 Monte Carlo simulation toolkit. This toolkit incorporates the UNIFIED model. Coefficients defined by the UNIFIED model were calculated from the bidirectional reflectance distribution function (BRDF) profiles measured with a scatterometer for several angles of incidence. Results were amended with profile measurements made by a profilometer.

© 2011 Optical Society of America

OCIS Codes
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(240.6700) Optics at surfaces : Surfaces
(290.1483) Scattering : BSDF, BRDF, and BTDF

ToC Category:

Original Manuscript: September 30, 2010
Revised Manuscript: November 7, 2010
Manuscript Accepted: December 7, 2010
Published: February 17, 2011

Libor Nozka, Miroslav Pech, Helena Hiklova, Dusan Mandat, Miroslav Hrabovsky, Petr Schovanek, and Miroslav Palatka, "BRDF profile of Tyvek and its implementation in the Geant4 simulation toolkit," Opt. Express 19, 4199-4209 (2011)

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