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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 5 — Feb. 28, 2011
  • pp: 4553–4559

Effect of speckle on APSCI method and Mueller Imaging

Debajyoti Upadhyay, Michael Richert, Eric Lacot, Antonello De Martino, and Xavier Orlik  »View Author Affiliations

Optics Express, Vol. 19, Issue 5, pp. 4553-4559 (2011)

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The principle of the polarimetric imaging method called APSCI (Adapted Polarization State Contrast Imaging) is to maximize the polarimetric contrast between an object and its background using specific polarization states of illumination and detection. We perform here a comparative study of the APSCI method with existing Classical Mueller Imaging(CMI) associated with polar decomposition in the presence of fully and partially polarized circular Gaussian speckle. The results show a noticeable increase of the Bhattacharyya distance used as our contrast parameter for the APSCI method, especially when the object and background exhibit several polarimetric properties simultaneously.

© 2011 Optical Society of America

OCIS Codes
(110.2970) Imaging systems : Image detection systems
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(110.5405) Imaging systems : Polarimetric imaging

ToC Category:
Imaging Systems

Original Manuscript: October 25, 2010
Revised Manuscript: December 15, 2010
Manuscript Accepted: December 17, 2010
Published: February 24, 2011

Debajyoti Upadhyay, Micheal Richert, Eric Lacot, Antonello De Martino, and Xavier Orlik, "Effect of speckle on APSCI method and Mueller Imaging," Opt. Express 19, 4553-4559 (2011)

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