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Effect of speckle on APSCI method and Mueller Imaging |
Optics Express, Vol. 19, Issue 5, pp. 4553-4559 (2011)
http://dx.doi.org/10.1364/OE.19.004553
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Abstract
The principle of the polarimetric imaging method called APSCI (Adapted Polarization State Contrast Imaging) is to maximize the polarimetric contrast between an object and its background using specific polarization states of illumination and detection. We perform here a comparative study of the APSCI method with existing Classical Mueller Imaging(CMI) associated with polar decomposition in the presence of fully and partially polarized circular Gaussian speckle. The results show a noticeable increase of the Bhattacharyya distance used as our contrast parameter for the APSCI method, especially when the object and background exhibit several polarimetric properties simultaneously.
© 2011 Optical Society of America
OCIS Codes
(110.2970) Imaging systems : Image detection systems
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.5430) Physical optics : Polarization
(110.5405) Imaging systems : Polarimetric imaging
ToC Category:
Imaging Systems
History
Original Manuscript: October 25, 2010
Revised Manuscript: December 15, 2010
Manuscript Accepted: December 17, 2010
Published: February 24, 2011
Citation
Debajyoti Upadhyay, Micheal Richert, Eric Lacot, Antonello De Martino, and Xavier Orlik, "Effect of speckle on APSCI method and Mueller Imaging," Opt. Express 19, 4553-4559 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-5-4553
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References
- M. Richert, X. Orlik, and A. De Martino, “Adapted Polarization state contrast imaging,” Opt. Express 17, 14199–14210 (2009). [CrossRef] [PubMed]
- S. Y. Lu, and R. A. Chipman, “Interpretation of Mueller matrices based on polar decomposition,” J. Opt. Soc. Am. A 13, 1106–1113 (1996). [CrossRef]
- H. Poincaré, Théorie mathématique de la lumière (GABAY, 1892). [PubMed]
- A. Bhattacharyya, “On a measure of divergence between two statistical populations defined by probability distributions,” Bull. Calcutta Math. Soc. 35, 99–109 (1943).
- J. W. Goodman, Speckle Phenomena in optics (Roberts & Company Pub., Colorado, 2007) pp. 48–50.
- P. Drude, “Über Oberflächenschichten,” Ann. Phys. 36, 86597 (1889).
- I. Jung, M. Vaupel, M. Pelton, R. Piner, D. A. Dikin, S. Stankovich, J. An, and R. S. Ruoff, “Characterization of Thermally Reduced Graphene Oxide by Imaging Ellipsometry,” J. Phys. Chem. C 112(23), 8499–8506 (2008). [CrossRef]
- M. P. Rowe, and E. N. Jr, “Pugh, J. S. Tyo, and N. Engheta, “Polarization-difference imaging: a biologically inspired technique for observation through scattering media,” Opt. Lett. 20, 608–610 (1995). [CrossRef] [PubMed]
- J. S. Tyo, M. P. Rowe, E. N. Pugh, Jr., and N. Engheta, “Target detection in optically scattering media by polarization-difference imaging,” Appl. Opt. 35, 1855–1870 (1996). [CrossRef] [PubMed]
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