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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 9 — Apr. 25, 2011
  • pp: 8662–8669

Remarkable decrease in threshold for electrically pumped random ultraviolet lasing from ZnO film by incorporation of Zn2TiO4 nanoparticles

Yunpeng Li, Xiangyang Ma, Mingsheng Xu, Luelue Xiang, and Deren Yang  »View Author Affiliations


Optics Express, Vol. 19, Issue 9, pp. 8662-8669 (2011)
http://dx.doi.org/10.1364/OE.19.008662


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Abstract

We have comparatively investigated electrically pumped random lasing (RL) actions of two metal-insulator-semiconductor structured devices using pure ZnO and Zn2TiO4-nanoparticle-incorporated ZnO films as the semiconductor components i.e. light-emitting layers, respectively. It is demonstrated that the device using the Zn2TiO4-nanoparticle-incorporated ZnO film as the light-emitting layer exhibits a much smaller threshold current for the electrically pumped RL, which is ascribed to the enhanced multiple light scattering by incorporation of Zn2TiO4 nanoparticles into ZnO film. It is believed that this work provides a strategy for developing low-threshold ZnO-based random lasers.

© 2011 OSA

OCIS Codes
(140.3610) Lasers and laser optics : Lasers, ultraviolet
(290.5890) Scattering : Scattering, stimulated
(250.5960) Optoelectronics : Semiconductor lasers

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: February 3, 2011
Revised Manuscript: March 16, 2011
Manuscript Accepted: March 21, 2011
Published: April 19, 2011

Citation
Yunpeng Li, Xiangyang Ma, Mingsheng Xu, Luelue Xiang, and Deren Yang, "Remarkable decrease in threshold for electrically pumped random ultraviolet lasing from ZnO film by incorporation of Zn2TiO4 nanoparticles," Opt. Express 19, 8662-8669 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-9-8662


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