Subsurface defect detection in materials
using optical coherence tomography

doi:10.1364/OE.2.000540

Optics Express

Editor: J. H. Eberly
Vol. 2, Iss. 13 — Jun. 22, 1998
pp: 540–545

Subsurface defect detection in materials using optical coherence tomography

Michael Duncan, Mark Bashkansky, and John Reintjes »View Author Affiliations

Optics Express, Vol. 2, Issue 13, pp. 540-545 (1998)
http://dx.doi.org/10.1364/OE.2.000540

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Abstract
Article Info
References (8)
Cited By
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Abstract

We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

[Optical Society of America ]

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(290.7050) Scattering : Turbid media

ToC Category:
Focus Issue: Optical methods for material inspection

History
Original Manuscript: March 26, 1998
Published: June 22, 1998

Citation
Michael Duncan, Mark Bashkansky, and John Reintjes, "Subsurface defect detection in materials using optical coherence tomography," Opt. Express 2, 540-545 (1998)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-2-13-540

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References

R. C. Youngquist, S. Carr, and D. E. N. Davies, "Optical coherence-domain reflectometry: a new optical evaluation technique," Opt. Lett. 12, 158-160 (1987). [CrossRef] [PubMed]
K. Takada, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1063 (1987). [CrossRef]
A. F. Fercher, K. Mengedoht, W. Werner, "Eye-length measurement by interferometry with partially coherent light," Opt. Lett. 13, 186-188 (1988). [CrossRef] [PubMed]
E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, "High-speed optical coherence domain reflectometry," Opt. Lett. 17, 151-153 (1992). [CrossRef] [PubMed]
V. M. Gelikonov, G. V. Gelikonov, R. V. Kuranov, K. I. Pravdenko, A. M. Sergeev, F. I. Feldshtein, Ya. I. Khanin, and D. V. Shabanov, "Coherent optical tomography of microscopic inhomogeneities in biological tissues," JETP Lett. 61, 159 (1995).
M. Bashkansky, M. D. Duncan, M. Kahn, D. Lewis, III and J. Reintjes, "Subsurface Defect Detection in Ceramics Using Optical Gated Techniques," Opt. Lett. 22, 61-63 (1997). [CrossRef] [PubMed]
J. A. Powell and D. J. Larkin, "Process-induced morphological defects in epitaxial CVD silicon carbide," Phys. Status Solidi B 202, 529-548 (1997). [CrossRef]
J. F. de Boer, T. E. Milner, M. J. C. van Gemert, J. S. Nelson, "Two-dimensional birefringence imaging in biological tissue by polarization-sensitive optical coherence tomography," Opt. Lett. 22, 934-936 (1997). [CrossRef] [PubMed]

Other

R. C. Youngquist, S. Carr, and D. E. N. Davies, "Optical coherence-domain reflectometry: a new optical evaluation technique," Opt. Lett. 12, 158-160 (1987). [CrossRef] [PubMed]
K. Takada, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1063 (1987). [CrossRef]
A. F. Fercher, K. Mengedoht, W. Werner, "Eye-length measurement by interferometry with partially coherent light," Opt. Lett. 13, 186-188 (1988). [CrossRef] [PubMed]
E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, "High-speed optical coherence domain reflectometry," Opt. Lett. 17, 151-153 (1992). [CrossRef] [PubMed]
V. M. Gelikonov, G. V. Gelikonov, R. V. Kuranov, K. I. Pravdenko, A. M. Sergeev, F. I. Feldshtein, Ya. I. Khanin, and D. V. Shabanov, "Coherent optical tomography of microscopic inhomogeneities in biological tissues," JETP Lett. 61, 159 (1995).
M. Bashkansky, M. D. Duncan, M. Kahn, D. Lewis, III and J. Reintjes, "Subsurface Defect Detection in Ceramics Using Optical Gated Techniques," Opt. Lett. 22, 61-63 (1997). [CrossRef] [PubMed]
J. A. Powell and D. J. Larkin, "Process-induced morphological defects in epitaxial CVD silicon carbide," Phys. Status Solidi B 202, 529-548 (1997). [CrossRef]
J. F. de Boer, T. E. Milner, M. J. C. van Gemert, J. S. Nelson, "Two-dimensional birefringence imaging in biological tissue by polarization-sensitive optical coherence tomography," Opt. Lett. 22, 934-936 (1997). [CrossRef] [PubMed]

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