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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 11 — May. 21, 2012
  • pp: 12378–12392

Use of thermal sieve to allow optical testing of cryogenic optical systems

Dae Wook Kim, Wenrui Cai, and James H. Burge  »View Author Affiliations


Optics Express, Vol. 20, Issue 11, pp. 12378-12392 (2012)
http://dx.doi.org/10.1364/OE.20.012378


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Abstract

Full aperture testing of large cryogenic optical systems has been impractical due to the difficulty of operating a large collimator at cryogenic temperatures. The Thermal Sieve solves this problem by acting as a thermal barrier between an ambient temperature collimator and the cryogenic system under test. The Thermal Sieve uses a set of thermally controlled baffles with array of holes that are lined up to pass the light from the collimator without degrading the wavefront, while attenuating the thermal background by nearly 4 orders of magnitude. This paper provides the theory behind the Thermal Sieve system, evaluates the optimization for its optical and thermal performance, and presents the design and analysis for a specific system.

© 2012 OSA

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 7, 2012
Revised Manuscript: May 10, 2012
Manuscript Accepted: May 11, 2012
Published: May 16, 2012

Citation
Dae Wook Kim, Wenrui Cai, and James H. Burge, "Use of thermal sieve to allow optical testing of cryogenic optical systems," Opt. Express 20, 12378-12392 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-11-12378


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References

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