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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 12 — Jun. 4, 2012
  • pp: 12793–12798

The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles

Chris J. Lee and Klaus J. Boller  »View Author Affiliations


Optics Express, Vol. 20, Issue 12, pp. 12793-12798 (2012)
http://dx.doi.org/10.1364/OE.20.012793


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Abstract

With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.

© 2012 OSA

OCIS Codes
(110.0110) Imaging systems : Imaging systems
(110.0180) Imaging systems : Microscopy
(110.4280) Imaging systems : Noise in imaging systems
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Microscopy

History
Original Manuscript: February 28, 2012
Revised Manuscript: April 19, 2012
Manuscript Accepted: April 24, 2012
Published: May 23, 2012

Virtual Issues
Vol. 7, Iss. 8 Virtual Journal for Biomedical Optics

Citation
Chris J. Lee and Klaus J. Boller, "The noise-limited-resolution for stimulated emission depletion microscopy of diffusing particles," Opt. Express 20, 12793-12798 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-12-12793


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