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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 16 — Jul. 30, 2012
  • pp: 18254–18267

Analysis of reflective Mach-Zehnder interferometry for electro-optic characterization of poled polymer films in multilayer structures

Dong Hun Park and Warren N. Herman  »View Author Affiliations

Optics Express, Vol. 20, Issue 16, pp. 18254-18267 (2012)

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We consider the Mach-Zehnder interferometer (MZI) method that specifically uses a poled organic thin film as one of the reflective mirrors in order to characterize the two independent electro-optic tensor elements r 13 and r 33 . We discuss both a simple analysis based on a three-layer structure and a rigorous method including multiple reflection effects in a multilayer structure. In doing so, we find that the simple analysis of the reflective MZI method yields identical results to the reflection ellipsometric method (simple Teng-Man method), first introduced by Teng and Man as well as Shildkraut in 1990, when the ratio of r 13 to r 33 obtained from the MZI method is used in the analysis of the simple Teng-Man method. Error introduced by ignoring the multilayer nature of the sample structures in the MZI method is discussed and corrections are given for previous expressions in the literature for the simple analysis.

© 2012 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(190.4710) Nonlinear optics : Optical nonlinearities in organic materials
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 14, 2012
Revised Manuscript: July 19, 2012
Manuscript Accepted: July 20, 2012
Published: July 25, 2012

Dong Hun Park and Warren N. Herman, "Analysis of reflective Mach-Zehnder interferometry for electro-optic characterization of poled polymer films in multilayer structures," Opt. Express 20, 18254-18267 (2012)

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