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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 18 — Aug. 27, 2012
  • pp: 20266–20275

Optics InfoBase > Optics Express > Volume 20 > Issue 18 > Page 20266

Optical characteristics of silicon nanowires grown from tin catalyst layers on silicon coated glass

Jeremy Ball, Anthony Centeno, Budhika G. Mendis, H. S. Reehal, and Neil Alford  »View Author Affiliations


Optics Express, Vol. 20, Issue 18, pp. 20266-20275 (2012)
http://dx.doi.org/10.1364/OE.20.020266


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Abstract

The optical characteristics of silicon nanowires grown on Si layers on glass have been modeled using the FDTD (Finite Difference Time Domain) technique and compared with experimental results. The wires were grown by the VLS (vapour-liquid-solid) method using Sn catalyst layers and exhibit a conical shape. The resulting measured and modeled absorption, reflectance and transmittance spectra have been investigated as a function of the thickness of the underlying Si layer and the initial catalyst layer, the latter having a strong influence on wire density. High levels of absorption (>90% in the visible wavelength range) and good agreement between the modeling and experiment have been observed when the nanowires have a relatively high density of ~4 wires/µm2. The experimental and modeled results diverge for samples with a lower density of wire growth. The results are discussed along with some implications for solar cell fabrication.

© 2012 OSA

OCIS Codes
(160.6000) Materials : Semiconductor materials
(310.6860) Thin films : Thin films, optical properties
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Thin Films

History
Original Manuscript: April 24, 2012
Revised Manuscript: June 29, 2012
Manuscript Accepted: July 6, 2012
Published: August 20, 2012

Citation
Jeremy Ball, Anthony Centeno, Budhika G. Mendis, H. S. Reehal, and Neil Alford, "Optical characteristics of silicon nanowires grown from tin catalyst layers on silicon coated glass," Opt. Express 20, 20266-20275 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-18-20266


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