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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 2 — Jan. 16, 2012
  • pp: 1281–1291

Estimation of multiple phases from a single fringe pattern in digital holographic interferometry

Gannavarpu Rajshekhar, Sai Siva Gorthi, and Pramod Rastogi  »View Author Affiliations


Optics Express, Vol. 20, Issue 2, pp. 1281-1291 (2012)
http://dx.doi.org/10.1364/OE.20.001281


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Abstract

Simultaneous measurement of multidimensional displacements using digital holographic interferometry involves multi-directional illumination of the deformed object and requires the reliable estimation of the resulting multiple interference phase distributions. The paper introduces an elegant method to simultaneously estimate the desired multiple phases from a single fringe pattern. The proposed method relies on modeling the reconstructed interference field as a piecewise multicomponent polynomial phase signal. Effectively, in a given region or segment, the reconstructed interference field is represented as the sum of different components i.e. complex signals with polynomial phases. The corresponding polynomial coefficients are estimated using the product high-order ambiguity function. To ensure proper matching of the estimated coefficients with the corresponding components, an amplitude based discrimination criterion is used. The main advantage of the proposed method is direct retrieval of multiple phases without the application of spatial carrier based filtering operations.

© 2011 OSA

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(090.1995) Holography : Digital holography

ToC Category:
Holography

History
Original Manuscript: November 14, 2011
Revised Manuscript: December 8, 2011
Manuscript Accepted: December 9, 2011
Published: January 5, 2012

Citation
Gannavarpu Rajshekhar, Sai Siva Gorthi, and Pramod Rastogi, "Estimation of multiple phases from a single fringe pattern in digital holographic interferometry," Opt. Express 20, 1281-1291 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-2-1281


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References

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