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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 20 — Sep. 24, 2012
  • pp: 22902–22913

Method to map individual electromagnetic field components inside a photonic crystal

T. Denis, B. Reijnders, J. H. H. Lee, P. J. M. van der Slot, W. L. Vos, and K.-J. Boller  »View Author Affiliations

Optics Express, Vol. 20, Issue 20, pp. 22902-22913 (2012)

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We present a method to map the absolute electromagnetic field strength inside photonic crystals. We apply the method to map the dominant electric field component Ez of a two-dimensional photonic crystal slab at microwave frequencies. The slab is placed between two mirrors to select Bloch standing waves and a subwavelength spherical scatterer is scanned inside the resulting resonator. The resonant Bloch frequencies shift depending on the electric field at the position of the scatterer. To map the electric field component Ez we measure the frequency shift in the reflection and transmission spectrum of the slab versus the scatterer position. Very good agreement is found between measurements and calculations without any adjustable parameters.

© 2012 OSA

OCIS Codes
(350.4238) Other areas of optics : Nanophotonics and photonic crystals
(160.5293) Materials : Photonic bandgap materials
(050.5298) Diffraction and gratings : Photonic crystals
(160.5298) Materials : Photonic crystals
(230.5298) Optical devices : Photonic crystals

ToC Category:
Photonic Crystals

Original Manuscript: July 4, 2012
Revised Manuscript: August 20, 2012
Manuscript Accepted: August 20, 2012
Published: September 21, 2012

T. Denis, B. Reijnders, J. H. H. Lee, P. J. M. van der Slot, W. L. Vos, and K.-J. Boller, "Method to map individual electromagnetic field components inside a photonic crystal," Opt. Express 20, 22902-22913 (2012)

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