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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 21 — Oct. 8, 2012
  • pp: 23798–23810

Extending single-photon optimized superconducting transition edge sensors beyond the single-photon counting regime

Thomas Gerrits, Brice Calkins, Nathan Tomlin, Adriana E. Lita, Alan Migdall, Richard Mirin, and Sae Woo Nam  »View Author Affiliations


Optics Express, Vol. 20, Issue 21, pp. 23798-23810 (2012)
http://dx.doi.org/10.1364/OE.20.023798


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Abstract

Typically, transition edge sensors resolve photon number of up to 10 or 20 photons, depending on the wavelength and TES design. We extend that dynamic range up to 1000 photons, while maintaining sub-shot noise detection process uncertainty of the number of detected photons and beyond that show a monotonic response up to ≈ 6 · 106 photons in a single light pulse. This mode of operation, which heats the sensor far beyond its transition edge into the normal conductive regime, offers a technique for connecting single-photon-counting measurements to radiant-power measurements at picowatt levels. Connecting these two usually incompatible operating regimes in a single detector offers significant potential for directly tying photon counting measurements to conventional cryogenic radiometric standards. In addition, our measurements highlight the advantages of a photon-number state source over a coherent pulse source as a tool for characterizing such a detector.

© 2012 OSA

OCIS Codes
(040.3780) Detectors : Low light level
(040.5570) Detectors : Quantum detectors
(120.5630) Instrumentation, measurement, and metrology : Radiometry

ToC Category:
Detectors

History
Original Manuscript: July 16, 2012
Revised Manuscript: September 11, 2012
Manuscript Accepted: September 18, 2012
Published: October 2, 2012

Citation
Thomas Gerrits, Brice Calkins, Nathan Tomlin, Adriana E. Lita, Alan Migdall, Richard Mirin, and Sae Woo Nam, "Extending single-photon optimized superconducting transition edge sensors beyond the single-photon counting regime," Opt. Express 20, 23798-23810 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-21-23798


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