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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 24886–24902

Third-harmonic generation microscopy with Bessel beams: a numerical study

Nicolas Olivier, Delphine Débarre, Pierre Mahou, and Emmanuel Beaurepaire  »View Author Affiliations


Optics Express, Vol. 20, Issue 22, pp. 24886-24902 (2012)
http://dx.doi.org/10.1364/OE.20.024886


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Abstract

We study theoretically and numerically third-harmonic generation (THG) from model geometries (interfaces, slabs, periodic media) illuminated by Bessel beams produced by focusing an annular intensity profile. Bessel beams exhibit a phase and intensity distribution near focus different from Gaussian beams, resulting in distinct THG phase matching properties and coherent scattering directions. Excitation wave vectors are controlled by adjusting the bounding aperture angles of the Bessel beam. In addition to extended depth-of-field imaging, this opens interesting perspectives for coherent nonlinear microscopy, such as extracting sample spatial frequencies in the λ/8 - λ range in the case of organized media.

© 2012 OSA

OCIS Codes
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(190.4160) Nonlinear optics : Multiharmonic generation
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Microscopy

History
Original Manuscript: August 3, 2012
Revised Manuscript: October 3, 2012
Manuscript Accepted: October 3, 2012
Published: October 16, 2012

Citation
Nicolas Olivier, Delphine Débarre, Pierre Mahou, and Emmanuel Beaurepaire, "Third-harmonic generation microscopy with Bessel beams: a numerical study," Opt. Express 20, 24886-24902 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-22-24886


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