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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 23 — Nov. 5, 2012
  • pp: 25317–25324

The circular-polarization phase-meter

Boris Bergues  »View Author Affiliations


Optics Express, Vol. 20, Issue 23, pp. 25317-25324 (2012)
http://dx.doi.org/10.1364/OE.20.025317


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Abstract

A new method to measure the carrier-envelope phase (CEP) of a strong few-cycle laser pulse is introduced. The new concept relies on above threshold ionization (ATI) in circularly polarized laser fields and allows for CEP tagging every single laser pulse generated in few-cycle laser systems at multi-kHz repetition rates. The implementation of the new method is described and discussed quantitatively. It is shown that the introduced circular-polarization phase-meter may offer a series of advantages over existing CEP-tagging schemes based on ATI in linearly polarized laser fields.

© 2012 OSA

OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
Ultrafast Optics

History
Original Manuscript: July 24, 2012
Revised Manuscript: September 21, 2012
Manuscript Accepted: September 25, 2012
Published: October 23, 2012

Citation
Boris Bergues, "The circular-polarization phase-meter," Opt. Express 20, 25317-25324 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-23-25317


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