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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 26 — Dec. 10, 2012
  • pp: B566–B573

Very long range quasi-Fourier spectroscopy for narrowband lasers

Masaaki Inoue, Fumihiko Ito, Xinyu Fan, and Yusuke Koshikiya  »View Author Affiliations


Optics Express, Vol. 20, Issue 26, pp. B566-B573 (2012)
http://dx.doi.org/10.1364/OE.20.00B566


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Abstract

The measurement of the spectral broadening, or temporal coherence property of very narrow linewidth lasers is not an easy task, while such a measurement is essential in any interferometric applications of the lasers. The beat note between two assumingly identical lasers only provides the convolutional spectral profile of the two lasers, but not characterizes the single laser. The delayed self-heterodyne interferometer (DSHI) would not be effective for kHz linewidth range because the finite delay cannot realize complete de-correlation. Here, we demonstrate, for the first time to our knowledge, the complete characterization of the modulus of the degree of coherence (DOC) of kHz linewidth lasers, with a self-referenced fashion where any other reference beam is not used, accordingly, characterize the spectral profile. The method is based on speckle statistical analysis of the Rayleigh scattering in the coherent fiber reflectometry, and would be a novel strong tool to characterize very narrow linewidth lasers.

© 2012 OSA

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Fibers, Fiber Devices, and Amplifiers

History
Original Manuscript: September 28, 2012
Revised Manuscript: November 27, 2012
Manuscript Accepted: November 27, 2012
Published: December 6, 2012

Virtual Issues
European Conference on Optical Communication 2012 (2012) Optics Express

Citation
Masaaki Inoue, Fumihiko Ito, Xinyu Fan, and Yusuke Koshikiya, "Very long range quasi-Fourier spectroscopy for narrowband lasers," Opt. Express 20, B566-B573 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-26-B566


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