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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 27 — Dec. 17, 2012
  • pp: 28070–28081

Narrow band, large angular width resonant reflection from a periodic high index grid at terahertz frequency

Olivier Parriaux, Thomas Kämpfe, Frédéric Garet, and Jean-Louis Coutaz  »View Author Affiliations


Optics Express, Vol. 20, Issue 27, pp. 28070-28081 (2012)
http://dx.doi.org/10.1364/OE.20.028070


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Abstract

The property of a thin silicon membrane with periodic air slits of definite depth and width to exhibit under normal incidence a close to 100% ultra-narrow band reflection peak is demonstrated experimentally in the terahertz frequency range on a single-crystal silicon grid fabricated by submillimeter microsystem technology. An analysis based on the true modes supported by the grid reveals the nature of such resonances and permits to sort out those exhibiting ultra-narrow band.

© 2012 OSA

OCIS Codes
(050.2230) Diffraction and gratings : Fabry-Perot
(050.2770) Diffraction and gratings : Gratings
(300.3700) Spectroscopy : Linewidth
(050.5745) Diffraction and gratings : Resonance domain
(300.6495) Spectroscopy : Spectroscopy, teraherz
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Diffraction and Gratings

History
Original Manuscript: September 14, 2012
Revised Manuscript: November 7, 2012
Manuscript Accepted: November 7, 2012
Published: December 4, 2012

Citation
Olivier Parriaux, Thomas Kämpfe, Frédéric Garet, and Jean-Louis Coutaz, "Narrow band, large angular width resonant reflection from a periodic high index grid at terahertz frequency," Opt. Express 20, 28070-28081 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-27-28070


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