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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 3 — Jan. 30, 2012
  • pp: 2034–2044

Measurement of the transverse electric field profile of light by a self-referencing method with direct phase determination

C. Bamber, B. Sutherland, A. Patel, C. Stewart, and J. S. Lundeen  »View Author Affiliations

Optics Express, Vol. 20, Issue 3, pp. 2034-2044 (2012)

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We present a method for measuring the transverse electric field profile of a beam of light which allows for direct phase retrieval. The measured values correspond, within a normalization constant, to the real and imaginary parts of the electric field in a plane normal to the direction of propagation. This technique represents a self-referencing method for probing the wavefront characteristics of light.

© 2012 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 23, 2011
Revised Manuscript: January 9, 2012
Manuscript Accepted: January 9, 2012
Published: January 13, 2012

C. Bamber, B. Sutherland, A. Patel, C. Stewart, and J. S. Lundeen, "Measurement of the transverse electric field profile of light by a self-referencing method with direct phase determination," Opt. Express 20, 2034-2044 (2012)

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