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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 4 — Feb. 13, 2012
  • pp: 3967–3974

Spatial coherence of electron bunches extracted from an arbitrarily shaped cold atom electron source

Sebastian D. Saliba, Corey T. Putkunz, David V. Sheludko, Andrew J. McCulloch, Keith A. Nugent, and Robert E. Scholten  »View Author Affiliations

Optics Express, Vol. 20, Issue 4, pp. 3967-3974 (2012)

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We describe the spatial coherence properties of a cold atom electron source in the framework of a quasihomogeneous wavefield. The model is used as the basis for direct measurements of the transverse spatial coherence length of electron bunches extracted from a cold atom electron source. The coherence length is determined from the measured visibility of a propagated electron distribution with a sinusoidal profile of variable spatial frequency. The electron distribution was controlled via the intensity profile of an atomic excitation laser beam patterned with a spatial light modulator. We measure a lower limit to the coherence length at the source of lc = 7.8 ± 0.9 nm.

© 2012 OSA

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(030.1640) Coherence and statistical optics : Coherence
(110.4980) Imaging systems : Partial coherence in imaging
(140.3300) Lasers and laser optics : Laser beam shaping
(080.5084) Geometric optics : Phase space methods of analysis

ToC Category:
Coherence and Statistical Optics

Original Manuscript: January 10, 2012
Manuscript Accepted: January 25, 2012
Published: February 1, 2012

Sebastian D. Saliba, Corey T. Putkunz, David V. Sheludko, Andrew J. McCulloch, Keith A. Nugent, and Robert E. Scholten, "Spatial coherence of electron bunches extracted from an arbitrarily shaped cold atom electron source," Opt. Express 20, 3967-3974 (2012)

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