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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 5 — Feb. 27, 2012
  • pp: 5127–5132

Raman concentrators in Ge nanowires with dielectric coatings

Jerome K. Hyun, In Soo Kim, Justin G. Connell, and Lincoln J. Lauhon  »View Author Affiliations


Optics Express, Vol. 20, Issue 5, pp. 5127-5132 (2012)
http://dx.doi.org/10.1364/OE.20.005127


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Abstract

Raman spectroscopy is a powerful tool for investigating many fundamental properties of nanostructures, but extrinsic effects including background scattering and laser-induced heating can limit the analysis of intrinsic properties. A thin SiO2 dielectric coating is found to enhance the Raman signal from a single Ge nanowire by a factor of two as a result of wave interference. Consequently, the coated nanowire experiences less heating than a bare nanowire at equivalent signal intensities. The results demonstrate a simple and effective method to extend the limits of Raman analysis on single nanostructures and facilitate their characterization.

© 2012 OSA

OCIS Codes
(300.6450) Spectroscopy : Spectroscopy, Raman
(310.1210) Thin films : Antireflection coatings
(160.4236) Materials : Nanomaterials

ToC Category:
Materials

History
Original Manuscript: November 15, 2011
Revised Manuscript: January 10, 2012
Manuscript Accepted: January 18, 2012
Published: February 16, 2012

Citation
Jerome K. Hyun, In Soo Kim, Justin G. Connell, and Lincoln J. Lauhon, "Raman concentrators in Ge nanowires with dielectric coatings," Opt. Express 20, 5127-5132 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-5-5127


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