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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 5 — Feb. 27, 2012
  • pp: 5789–5801

Numerical and experimental studies of coupling-induced phase shift in resonator and interferometric integrated optics devices

L. Y. M. Tobing, L. Tjahjana, S. Darmawan, and D. H. Zhang  »View Author Affiliations


Optics Express, Vol. 20, Issue 5, pp. 5789-5801 (2012)
http://dx.doi.org/10.1364/OE.20.005789


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Abstract

Coupling induced effects are higher order effects inherent in waveguide evanescent coupling that are known to spectrally distort optical performances of integrated optics devices formed by coupled resonators. We present both numerical and experimental studies of coupling-induced phase shift in various basic integrated optics devices. Rigorous finite difference time domain simulations and systematic experimental characterizations of different basic structures were conducted for more accurate parameter extraction, where it can be observed that coupling induced wave vector may change sign at the increasing gap separation. The devices characterized in this work were fabricated by CMOS-process 193nm Deep UV (DUV) lithography in silicon-on-insulator (SOI) technology.

© 2012 OSA

OCIS Codes
(230.3120) Optical devices : Integrated optics devices
(230.5750) Optical devices : Resonators

ToC Category:
Optical Devices

History
Original Manuscript: October 6, 2011
Revised Manuscript: December 18, 2011
Manuscript Accepted: December 19, 2011
Published: February 24, 2012

Citation
L. Y. M. Tobing, L. Tjahjana, S. Darmawan, and D. H. Zhang, "Numerical and experimental studies of coupling-induced phase shift in resonator and interferometric integrated optics devices," Opt. Express 20, 5789-5801 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-5-5789


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