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Probability theory for 3-layer remote sensing radiative transfer model: univariate case |
Optics Express, Vol. 20, Issue 9, pp. 10004-10033 (2012)
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Abstract
A probability model for a 3-layer radiative transfer model (foreground layer, cloud layer, background layer, and an external source at the end of line of sight) has been developed. The 3-layer model is fundamentally important as the primary physical model in passive infrared remote sensing. The probability model is described by the Johnson family of distributions that are used as a fit for theoretically computed moments of the radiative transfer model. From the Johnson family we use the SU distribution that can address a wide range of skewness and kurtosis values (in addition to addressing the first two moments, mean and variance). In the limit, SU can also describe lognormal and normal distributions. With the probability model one can evaluate the potential for detecting a target (vapor cloud layer), the probability of observing thermal contrast, and evaluate performance (receiver operating characteristics curves) in clutter-noise limited scenarios. This is (to our knowledge) the first probability model for the 3-layer remote sensing geometry that treats all parameters as random variables and includes higher-order statistics.
© 2012 OSA
OCIS Codes
(000.5490) General : Probability theory, stochastic processes, and statistics
(010.1320) Atmospheric and oceanic optics : Atmospheric transmittance
(010.1330) Atmospheric and oceanic optics : Atmospheric turbulence
(030.5620) Coherence and statistical optics : Radiative transfer
(300.6340) Spectroscopy : Spectroscopy, infrared
(280.4991) Remote sensing and sensors : Passive remote sensing
(290.6815) Scattering : Thermal emission
ToC Category:
Atmospheric and Oceanic Optics
History
Original Manuscript: January 11, 2012
Revised Manuscript: February 8, 2012
Manuscript Accepted: February 9, 2012
Published: April 17, 2012
Citation
, "Probability theory for 3-layer remote sensing radiative transfer model: univariate case," Opt. Express 20, 10004-10033 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-9-10004
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