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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 1 — Jan. 14, 2013
  • pp: 544–555

Silicon on ultra-low-loss waveguide photonic integration platform

Jared F. Bauters, Michael L. Davenport, Martijn J. R. Heck, J. K. Doylend, Arnold Chen, Alexander W. Fang, and John E. Bowers  »View Author Affiliations


Optics Express, Vol. 21, Issue 1, pp. 544-555 (2013)
http://dx.doi.org/10.1364/OE.21.000544


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Abstract

We demonstrate a novel integrated silicon and ultra-low-loss Si3N4 waveguide platform. Coupling between layers is achieved with (0.4 ± 0.2) dB of loss per transition and a 20 nm 3-dB bandwidth for one tapered coupler design and with (0.8 ± 0.2) dB of loss per transition and a 100 nm 3-dB bandwidth for another. The minimum propagation loss measured in the ultra-low-loss waveguides is 1.2 dB/m in the 1590 nm wavelength regime.

© 2013 OSA

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(230.7390) Optical devices : Waveguides, planar

ToC Category:
Integrated Optics

History
Original Manuscript: September 26, 2012
Revised Manuscript: November 3, 2012
Manuscript Accepted: November 5, 2012
Published: January 7, 2013

Citation
Jared F. Bauters, Michael L. Davenport, Martijn J. R. Heck, J. K. Doylend, Arnold Chen, Alexander W. Fang, and John E. Bowers, "Silicon on ultra-low-loss waveguide photonic integration platform," Opt. Express 21, 544-555 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-1-544


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References

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