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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 14 — Jul. 15, 2013
  • pp: 16629–16638

Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures

Johanna Trägårdh and Henkjan Gersen  »View Author Affiliations


Optics Express, Vol. 21, Issue 14, pp. 16629-16638 (2013)
http://dx.doi.org/10.1364/OE.21.016629


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Abstract

We show how a combination of near-field scanning optical microscopy with crossed beam spectral interferometry allows a local measurement of the spectral phase and amplitude of light propagating in photonic structures. The method only requires measurement at the single point of interest and at a reference point, to correct for the relative phase of the interferometer branches, to retrieve the dispersion properties of the sample. Furthermore, since the measurement is performed in the spectral domain, the spectral phase and amplitude could be retrieved from a single camera frame, here in 70ms for a signal power of less than 100pW limited by the dynamic range of the 8-bit camera. The method is substantially faster than most previous time-resolved NSOM methods that are based on time-domain interferometry, which also reduced problems with drift. We demonstrate how the method can be used to measure the refractive index and group velocity in a waveguide structure.

© 2013 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(160.4760) Materials : Optical properties
(320.7100) Ultrafast optics : Ultrafast measurements
(180.4243) Microscopy : Near-field microscopy

ToC Category:
Microscopy

History
Original Manuscript: February 25, 2013
Revised Manuscript: May 16, 2013
Manuscript Accepted: May 17, 2013
Published: July 3, 2013

Citation
Johanna Trägårdh and Henkjan Gersen, "Combining near-field scanning optical microscopy with spectral interferometry for local characterization of the optical electric field in photonic structures," Opt. Express 21, 16629-16638 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-14-16629


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