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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 14 — Jul. 15, 2013
  • pp: 16742–16752

Investigation of interface states in single-negative metamaterial layered structures based on the phase properties

Jian Zheng, Yihang Chen, Zefeng Chen, Xinggang Wang, Peng Han, Zehui Yong, Yu Wang, Chi Wah Leung, and Costas M. Soukoulis  »View Author Affiliations


Optics Express, Vol. 21, Issue 14, pp. 16742-16752 (2013)
http://dx.doi.org/10.1364/OE.21.016742


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Abstract

The physical mechanism of the interface states in layered structures consisting of single-negative metamaterials is investigated using a simple resonant cavity model. We found that the interface states and their corresponding tunneling transmission modes appeared when the resonant condition is satisfied. Such resonant condition depends on the phase changes inside the resonant cavity. Based on these results, we proposed an efficient method to precisely predict the frequencies of the tunneling interface states inside the single-negative metamaterial layers. Our method is effective for interface states corresponding to perfect or imperfect tunneling transmission. Composite right/left-handed transmission lines were used to realize the pair and sandwich metamaterial layered structures in the microwave region. Electromagnetic tunneling interface states were observed in the measurements, which agreed well with the theory. Our study offers a way for effectively designing metamaterial devices with novel electromagnetic tunneling properties.

© 2013 OSA

OCIS Codes
(260.2110) Physical optics : Electromagnetic optics
(350.5030) Other areas of optics : Phase
(160.3918) Materials : Metamaterials

ToC Category:
Metamaterials

History
Original Manuscript: April 10, 2013
Revised Manuscript: June 7, 2013
Manuscript Accepted: July 1, 2013
Published: July 5, 2013

Citation
Jian Zheng, Yihang Chen, Zefeng Chen, Xinggang Wang, Peng Han, Zehui Yong, Yu Wang, Chi Wah Leung, and Costas M. Soukoulis, "Investigation of interface states in single-negative metamaterial layered structures based on the phase properties," Opt. Express 21, 16742-16752 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-14-16742


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