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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 19 — Sep. 23, 2013
  • pp: 21756–21765

A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description

Huimin Yue, Yuxiang Wu, Biyu Zhao, Zhonghua Ou, Yongzhi Liu, and Yong Liu  »View Author Affiliations

Optics Express, Vol. 21, Issue 19, pp. 21756-21765 (2013)

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In phase measuring deflectometry (PMD), a camera observes a sinusoidal fringe pattern via the surface of a specular object under test. Any slope variations of the surface lead to distortions of the observed pattern. Without height-angle ambiguity, carrier removal process is adopted to evaluate the variation of surface slope from phase distribution when a quasi-plane is measured. However, in the usual measurement system, the carrier phase will be nonlinear due to the restrictions of system geometries. In this paper, based on the analytical carrier phase description in PMD, a carrier removal method is proposed to remove the nonlinear carrier phase. Both the theoretical analysis and the experiment results are presented. By comparison with reference-subtraction method and series-expansion method, this proposed method can achieve carrier removal process with only the measurement of one single object, as well as high accuracy and time-saving.

© 2013 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(130.4310) Integrated optics : Nonlinear

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 23, 2013
Revised Manuscript: July 15, 2013
Manuscript Accepted: July 18, 2013
Published: September 9, 2013

Huimin Yue, Yuxiang Wu, Biyu Zhao, Zhonghua Ou, Yongzhi Liu, and Yong Liu, "A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description," Opt. Express 21, 21756-21765 (2013)

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  1. M. C. Knauer, J. Kaminski, and G. Häusler, “Phase measuring deflectometry: a new approach to measure specular free-form surfaces,” Proc. SPIE5457, 366–376 (2004). [CrossRef]
  2. L. Huang, C. S. Ng, and A. K. Asundi, “Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry,” Opt. Express19(13), 12809–12814 (2011). [CrossRef] [PubMed]
  3. L. Song, H. M. Yue, Y. X. Wu, Y. Liu, and Y. Z. Liu, “Fringe Reflection for Specular Object Measurement and Analysis on Variable Lateral Scales,” Journal of Optoelectronics·Laser23(11), 2154-2162 (2012).
  4. S. Zhang, D. Van Der Weide, and J. Oliver, “Superfast phase-shifting method for 3-D shape measurement,” Opt. Express18(9), 9684–9689 (2010). [CrossRef] [PubMed]
  5. A. Asundi and Z. Wensen, “Fast phase-unwrapping algorithm based on a gray-scale mask and flood fill,” Appl. Opt.37(23), 5416–5420 (1998). [CrossRef] [PubMed]
  6. H. W. Guo, M. Y. Chen, and P. Zheng, “Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry [corrected],” Opt. Lett.31(24), 3588–3590 (2006). [CrossRef] [PubMed]
  7. C. Quan, C. J. Tay, and L. J. Chen, “A study on carrier-removal techniques in fringe projection profilometry,” Opt. Laser Technol.39(6), 1155–1161 (2007). [CrossRef]
  8. Q. C. Zhang and Z. Y. Wu, “A carrier removal method in Fourier transform profilometry with Zernike polynomials,” Opt. Lasers Eng.51(3), 253–260 (2013). [CrossRef]
  9. L. J. Chen and C. J. Tay, “Carrier phase component removal: a generalized least-squares approach,” J. Opt. Soc. Am. A23(2), 435–443 (2006). [CrossRef] [PubMed]
  10. L. Song, H. M. Yue, H. Kim, Y. X. Wu, Y. Liu, and Y. Z. Liu, “A study on carrier phase distortion in phase measuring deflectometry with non-telecentric imaging,” Opt. Express20(22), 24505–24515 (2012). [CrossRef] [PubMed]

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