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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 2 — Jan. 28, 2013
  • pp: 1804–1811

Universal scaling of plasmonic refractive index sensors

Yen-Kai Chang, Zong-Xing Lou, Kao-Der Chang, and Chih-Wei Chang  »View Author Affiliations


Optics Express, Vol. 21, Issue 2, pp. 1804-1811 (2013)
http://dx.doi.org/10.1364/OE.21.001804


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Abstract

We establish experimental and numerical evidence that the refractive index sensitivities of various subwavelength plasmonic sensors obey a simple universal scaling relation that the sensitivities linearly increase with λm/neff (where λm is the resonant wavelengths and neff is the effective refractive index of the environment) and exhibit a slope equal to 1 instead of 2 predicted theoretically. The universal scaling relation is independent of the geometrical structures or contributions of multipolar resonances of individual metal structures (i.e. plasmonic atoms). It is also independent of spatial distributions or field-enhancements of electromagnetic hot spots in coupled metal structures (i.e. plasmonic molecules). The universal scaling relation reveals the fundamental standing wave resonances for all plasmonic atoms and the predominant near-field electric couplings for most plasmonic molecules. The established universal relation also helps to exclude some magnetically coupled plasmonic molecules for practical applications due to their reduced sensitivities.

© 2013 OSA

OCIS Codes
(250.5403) Optoelectronics : Plasmonics
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Sensors

History
Original Manuscript: November 13, 2012
Revised Manuscript: January 8, 2013
Manuscript Accepted: January 9, 2013
Published: January 16, 2013

Citation
Yen-Kai Chang, Zong-Xing Lou, Kao-Der Chang, and Chih-Wei Chang, "Universal scaling of plasmonic refractive index sensors," Opt. Express 21, 1804-1811 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-2-1804


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