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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 23 — Nov. 18, 2013
  • pp: 27519–27536

Design considerations regarding ellipsoidal mirror based reflectometers

Michael R. Benson and Michael A. Marciniak  »View Author Affiliations

Optics Express, Vol. 21, Issue 23, pp. 27519-27536 (2013)

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Hemi-ellipsoidal mirrors are used in reflection-based measurements due to their ability to collect light scattered from one focal point at the other. In this paper, a radiometric model of this energy transfer is derived for arbitrary mirror and detector geometries. This model is used to examine the imaging characteristics of the mirror away from focus for both diffuse and specular light. The radiometric model is applied to several detector geometries for measuring the Directional Hemispherical Reflectance for both diffuse and specular samples. The angular absorption characteristics of the detector are then applied to the measurement to address measurement accuracy for diffuse and specular samples. Examining different detector configurations shows the effectiveness of flat detectors at angles ranging from normal to 50°, and that multifaceted detectors can function from normal incidence to grazing angles.

© 2013 OSA

OCIS Codes
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: May 16, 2013
Revised Manuscript: August 19, 2013
Manuscript Accepted: August 22, 2013
Published: November 4, 2013

Michael R. Benson and Michael A. Marciniak, "Design considerations regarding ellipsoidal mirror based reflectometers," Opt. Express 21, 27519-27536 (2013)

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