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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 26 — Dec. 30, 2013
  • pp: 32358–32370

Electrical heating synchronized with IR imaging to determine thin film defects

Kimmo Leppänen, Juha Saarela, Risto Myllylä, and Tapio Fabritius  »View Author Affiliations


Optics Express, Vol. 21, Issue 26, pp. 32358-32370 (2013)
http://dx.doi.org/10.1364/OE.21.032358


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Abstract

Measuring conductive thin film properties during production and in end products is a challenge. The main demands for the measurements are: production control, reliability and functionality in final applications. There are several ways to measure thin film quality in a laboratory environment, however these methods are poorly applicable for production facilities. In order to bypass the limitations of existing methods, a simple synchronized heating and IR-imaging based system was implemented. To demonstrate the proposed method, Indium Tin Oxide (ITO) was selected as an example of conductive thin films. PET-ITO films were bent to obtain samples with defects. The proposed method was used and automated signal processing was developed. The results show that the system developed here is suitable for defining breakage types and localizing defects.

© 2013 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(110.6820) Imaging systems : Thermal imaging
(220.4840) Optical design and fabrication : Testing
(310.3840) Thin films : Materials and process characterization

ToC Category:
Thin Films

History
Original Manuscript: October 29, 2013
Revised Manuscript: December 13, 2013
Manuscript Accepted: December 13, 2013
Published: December 19, 2013

Citation
Kimmo Leppänen, Juha Saarela, Risto Myllylä, and Tapio Fabritius, "Electrical heating synchronized with IR imaging to determine thin film defects," Opt. Express 21, 32358-32370 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-26-32358


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