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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 3 — Feb. 11, 2013
  • pp: 2592–2605

Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer

Chunmin Zhang, Wenyi Ren, Tingkui Mu, Lili Fu, and Chenling Jia  »View Author Affiliations


Optics Express, Vol. 21, Issue 3, pp. 2592-2605 (2013)
http://dx.doi.org/10.1364/OE.21.002592


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Abstract

Based on empirical mode decomposition (EMD), the background removal and de-noising procedures of the data taken by polarization interference imaging interferometer (PIIS) are implemented. Through numerical simulation, it is discovered that the data processing methods are effective. The assumption that the noise mostly exists in the first intrinsic mode function is verified, and the parameters in the EMD thresholding de-noising methods is determined. In comparison, the wavelet and windowed Fourier transform based thresholding de-noising methods are introduced. The de-noised results are evaluated by the SNR, spectral resolution and peak value of the de-noised spectrums. All the methods are used to suppress the effect from the Gaussian and Poisson noise. The de-noising efficiency is higher for the spectrum contaminated by Gaussian noise. The interferogram obtained by the PIIS is processed by the proposed methods. Both the interferogram without background and noise free spectrum are obtained effectively. The adaptive and robust EMD based methods are effective to the background removal and de-noising in PIIS.

© 2013 OSA

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(300.0300) Spectroscopy : Spectroscopy

ToC Category:
Spectroscopy

History
Original Manuscript: November 9, 2012
Revised Manuscript: December 28, 2012
Manuscript Accepted: January 12, 2013
Published: January 28, 2013

Citation
Chunmin Zhang, Wenyi Ren, Tingkui Mu, Lili Fu, and Chenling Jia, "Empirical mode decomposition based background removal and de-noising in polarization interference imaging spectrometer," Opt. Express 21, 2592-2605 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-3-2592


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