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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 3 — Feb. 11, 2013
  • pp: 2913–2919

Near-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation

Peter Hermann, Arne Hoehl, Piotr Patoka, Florian Huth, Eckart Rühl, and Gerhard Ulm  »View Author Affiliations

Optics Express, Vol. 21, Issue 3, pp. 2913-2919 (2013)

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We demonstrate scanning near-field optical microscopy with a spatial resolution below 100 nm by using low intensity broadband synchrotron radiation in the IR regime. The use of such a broadband radiation source opens up the possibility to perform nano-Fourier-transform infrared spectroscopy over a wide spectral range.

© 2013 OSA

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(240.0240) Optics at surfaces : Optics at surfaces
(300.0300) Spectroscopy : Spectroscopy
(180.4243) Microscopy : Near-field microscopy
(310.6188) Thin films : Spectral properties

ToC Category:

Original Manuscript: November 16, 2012
Revised Manuscript: December 17, 2012
Manuscript Accepted: December 18, 2012
Published: January 30, 2013

Peter Hermann, Arne Hoehl, Piotr Patoka, Florian Huth, Eckart Rühl, and Gerhard Ulm, "Near-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation," Opt. Express 21, 2913-2919 (2013)

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