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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 6 — Mar. 25, 2013
  • pp: 6837–6844

Highly directional thermal emission from two-dimensional silicon structures

Troy Ribaudo, David W. Peters, A. Robert Ellis, Paul S. Davids, and Eric A. Shaner  »View Author Affiliations


Optics Express, Vol. 21, Issue 6, pp. 6837-6844 (2013)
http://dx.doi.org/10.1364/OE.21.006837


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Abstract

We simulate, fabricate, and characterize near perfectly absorbing two-dimensional grating structures in the thermal infrared using heavily doped silicon (HdSi) that supports long wave infrared surface plasmon polaritons (LWIR SPP’s). The devices were designed and optimized using both finite difference time domain (FDTD) and rigorous coupled wave analysis (RCWA) simulation techniques to satisfy stringent requirements for thermal management applications requiring high thermal radiation absorption over a narrow angular range and low visible radiation absorption over a broad angular range. After optimization and fabrication, characterization was performed using reflection spectroscopy and normal incidence emissivity measurements. Excellent agreement between simulation and experiment was obtained.

© 2013 OSA

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
(350.2770) Other areas of optics : Gratings

ToC Category:
Optics at Surfaces

History
Original Manuscript: January 14, 2013
Revised Manuscript: February 19, 2013
Manuscript Accepted: February 20, 2013
Published: March 12, 2013

Citation
Troy Ribaudo, David W. Peters, A. Robert Ellis, Paul S. Davids, and Eric A. Shaner, "Highly directional thermal emission from two-dimensional silicon structures," Opt. Express 21, 6837-6844 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-6-6837


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