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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 7 — Apr. 8, 2013
  • pp: 8904–8915

Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection

Aongus McCarthy, Nils J. Krichel, Nathan R. Gemmell, Ximing Ren, Michael G. Tanner, Sander N. Dorenbos, Val Zwiller, Robert H. Hadfield, and Gerald S. Buller  »View Author Affiliations


Optics Express, Vol. 21, Issue 7, pp. 8904-8915 (2013)
http://dx.doi.org/10.1364/OE.21.008904


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Abstract

This paper highlights a significant advance in time-of-flight depth imaging: by using a scanning transceiver which incorporated a free-running, low noise superconducting nanowire single-photon detector, we were able to obtain centimeter resolution depth images of low-signature objects in daylight at stand-off distances of the order of one kilometer at the relatively eye-safe wavelength of 1560 nm. The detector used had an efficiency of 18% at 1 kHz dark count rate, and the overall system jitter was ~100 ps. The depth images were acquired by illuminating the scene with an optical output power level of less than 250 µW average, and using per-pixel dwell times in the millisecond regime.

© 2013 OSA

OCIS Codes
(030.5260) Coherence and statistical optics : Photon counting
(030.5290) Coherence and statistical optics : Photon statistics
(040.3780) Detectors : Low light level
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(280.3400) Remote sensing and sensors : Laser range finder

ToC Category:
Imaging Systems

History
Original Manuscript: January 22, 2013
Revised Manuscript: February 21, 2013
Manuscript Accepted: February 21, 2013
Published: April 4, 2013

Citation
Aongus McCarthy, Nils J. Krichel, Nathan R. Gemmell, Ximing Ren, Michael G. Tanner, Sander N. Dorenbos, Val Zwiller, Robert H. Hadfield, and Gerald S. Buller, "Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection," Opt. Express 21, 8904-8915 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-7-8904


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