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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 8 — Apr. 22, 2013
  • pp: 10111–10120

The effect of absorption and coherent interference in the photoluminescence and electroluminescence spectra of SRO/SRN MIS capacitors

Joan Juvert, Alfredo Abelardo González-Fernández, Andreu Llobera, and Carlos Domínguez  »View Author Affiliations

Optics Express, Vol. 21, Issue 8, pp. 10111-10120 (2013)

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In this paper we present a technique that can be used to study the effect of absorption and coherent interference in the luminescence of multilayer structures. We apply the technique to the measured photoluminescence and electroluminescence spectra of MIS capacitors where the insulator is composed of a silicon rich oxide (SRO)/silicon rich nitride (SRN) bilayer structure. We remove the effect of the multilayer stack on the measured photoluminescence spectrum of the samples without the metal contact to find the intrinsic spectrum. Then we apply the effect of the MIS structure on the intrinsic spectrum in order to calculate the electroluminescence spectrum. Good agreement with the experimentally measured EL spectrum is found. We discuss which parameters affect the spectra most significantly.

© 2013 OSA

OCIS Codes
(160.2100) Materials : Electro-optical materials
(160.2540) Materials : Fluorescent and luminescent materials
(160.3130) Materials : Integrated optics materials
(160.6000) Materials : Semiconductor materials
(230.0250) Optical devices : Optoelectronics
(230.4170) Optical devices : Multilayers
(250.5230) Optoelectronics : Photoluminescence
(260.3800) Physical optics : Luminescence
(310.6860) Thin films : Thin films, optical properties
(310.6845) Thin films : Thin film devices and applications

ToC Category:
Optical Devices

Original Manuscript: January 16, 2013
Revised Manuscript: March 7, 2013
Manuscript Accepted: March 12, 2013
Published: April 16, 2013

Joan Juvert, Alfredo Abelardo González-Fernández, Andreu Llobera, and Carlos Domínguez, "The effect of absorption and coherent interference in the photoluminescence and electroluminescence spectra of SRO/SRN MIS capacitors," Opt. Express 21, 10111-10120 (2013)

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