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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 8 — Apr. 22, 2013
  • pp: 9824–9838

Multi-sensor image registration based on algebraic projective invariants

Bin Li, Wei Wang, and Hao Ye  »View Author Affiliations


Optics Express, Vol. 21, Issue 8, pp. 9824-9838 (2013)
http://dx.doi.org/10.1364/OE.21.009824


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Abstract

A new automatic feature-based registration algorithm is presented for multi-sensor images with projective deformation. Contours are firstly extracted from both reference and sensed images as basic features in the proposed method. Since it is difficult to design a projective-invariant descriptor from the contour information directly, a new feature named Five Sequential Corners (FSC) is constructed based on the corners detected from the extracted contours. By introducing algebraic projective invariants, we design a descriptor for each FSC that is ensured to be robust against projective deformation. Further, no gray scale related information is required in calculating the descriptor, thus it is also robust against the gray scale discrepancy between the multi-sensor image pairs. Experimental results utilizing real image pairs are presented to show the merits of the proposed registration method.

© 2013 OSA

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.5010) Image processing : Pattern recognition
(100.3008) Image processing : Image recognition, algorithms and filters

ToC Category:
Image Processing

History
Original Manuscript: January 9, 2013
Revised Manuscript: March 17, 2013
Manuscript Accepted: April 2, 2013
Published: April 12, 2013

Citation
Bin Li, Wei Wang, and Hao Ye, "Multi-sensor image registration based on algebraic projective invariants," Opt. Express 21, 9824-9838 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-8-9824


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