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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 8 — Apr. 22, 2013
  • pp: 9906–9914

Optical property study of FePt-C nanocomposite thin film for heat-assisted magnetic recording

Z. H. Cen, B. X. Xu, J. F. Hu, J. M. Li, K. M. Cher, Y. T. Toh, K. D. Ye, and J. Zhang  »View Author Affiliations

Optics Express, Vol. 21, Issue 8, pp. 9906-9914 (2013)

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Optical properties of the FePt-C nanocomposite thin film that was synthesized by sputtering with MgO/NiTa underlayer on glass substrate have been determined by an approach combining spectroscopic ellipsometry and transmission over the wavelength range of 380 – 1700 nm. It was observed that the refractive index is larger than the extinction coefficient, indicating that free electron absorption is not the dominant optical transition in the FePt-C thin film. Compared with FePt thin film, the FePt-C thin film has smaller optical constants, which lead to better optical performance including smaller optical spot on recording media and higher transducer efficiency for heat assisted magnetic recording.

© 2013 OSA

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(050.1755) Diffraction and gratings : Computational electromagnetic methods
(160.4236) Materials : Nanomaterials
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Optics at Surfaces

Original Manuscript: December 12, 2012
Revised Manuscript: March 10, 2013
Manuscript Accepted: March 12, 2013
Published: April 15, 2013

Z. H. Cen, B. X. Xu, J. F. Hu, J. M. Li, K. M. Cher, Y. T. Toh, K. D. Ye, and J. Zhang, "Optical property study of FePt-C nanocomposite thin film for heat-assisted magnetic recording," Opt. Express 21, 9906-9914 (2013)

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  1. T. Suzuki, H. Muraoka, Y. Nakamura, and K. Ouchi, “Design and recording properties of FePt perpendicular media,” IEEE Trans. Magn.39(2), 691–696 (2003). [CrossRef]
  2. J. S. Chen, J. F. Hu, B. C. Lim, Y. F. Ding, G. M. Chow, and G. Ju, “Development of L10 FePt:C (001) thin films with high coercivity and small grain size for ultra-high-density magnetic recording media,” IEEE Trans. Magn.45(2), 839–844 (2009). [CrossRef]
  3. K. F. Dong, H. H. Li, Y. G. Peng, G. Ju, G. M. Chow, and J. S. Chen, “Well-isolated L10 FePt-SiNx-C nanocomposite films with large coercivity and small grain size,” J. Appl. Phys.111(7), 07A308 (2012). [CrossRef]
  4. J. S. Chen, B. C. Lim, Y. F. Ding, J. F. Hu, G. M. Chow, and G. Ju, “Granular L10 FePt-X (X=C, TiO2, Ta2O5) (001) nanocomposite films with small grain size for high density magnetic recording,” J. Appl. Phys.105(7), 07B702 (2009). [CrossRef]
  5. S. D. Granz and M. H. Kryder, “Granular L10 FePt (001) thin films for Heat Assisted Magnetic Recording,” J. Magn. Magn. Mater.324(3), 287–294 (2012). [CrossRef]
  6. T. Song, T. J. Zhou, C. L. Chen, and H. Gong, “XPS study of thermal effects on FePt and FePtAg nanoparticles,” IEEE Trans. Magn.41(10), 3367–3369 (2005). [CrossRef]
  7. M. H. Kryder, E. C. Gage, T. W. McDaniel, W. A. Challener, R. E. Rottmayer, G. P. Ju, Y. T. Hsia, and M. F. Erden, “Heat Assisted Magnetic Recording,” Proc. IEEE96(11), 1810–1835 (2008). [CrossRef]
  8. S. J. Lee, A. C. C. Yu, C. C. H. Lo, and M. Fan, “Optical properties of monodispersive FePt nanoparticle films,” Phys. Status Solidi201(13), 3031–3036 (2004) (a). [CrossRef]
  9. S. L. Lee, C. C. H. Lo, A. C. C. Yu, and M. Fan, “Spectroscopic ellipsometry study of FePt nanoparticle films,” Phys. Status Solidi203(15), 3801–3804 (2006) (a). [CrossRef]
  10. J. F. Hu, J. S. Chen, B. C. Lim, and B. Liu, “Underlayer diffusion-induced enhancement of coercivity in high anisotropy FePt thin films,” J. Magn. Magn. Mater.320(22), 3068–3070 (2008). [CrossRef]
  11. G. K. Pribil, B. Johs, and N. J. Ianno, “Dielectric function of thin metal films by combined in situ transmission ellipsometry and intensity measurements,” Thin Solid Films455–456, 443–449 (2004). [CrossRef]
  12. Y. H. Yang and J. R. Abelson, “Spectroscopic ellipsometry of thin films on transparent substrates: A formalism for data interpretation,” J. Vac. Sci. Technol. A13(3), 1145–1149 (1995). [CrossRef]
  13. B. Harbecke, “Coherent and incoherent reflection and transmission of multilayer structures,” Appl. Phys. B39(3), 165–170 (1986). [CrossRef]
  14. N. Zhou, E. C. Kinzel, and X. F. Xu, “Nanoscale ridge aperture as near-field transducer for heat-assisted magnetic recording,” Appl. Opt.50(31), G42–G46 (2011). [CrossRef] [PubMed]
  15. D. A. G. Bruggeman, “Calculation of various physics constants in heterogenous substances I. Dielectricity constants and conductivity of mixed bodies from isotropic substances,” Ann. Phys. (Leipzig)24(7), 636–664 (1935).
  16. S. Logothetidis, M. Gioti, S. Lousinian, and S. Fotiadou, “Haemocompatibility studies on carbon-based thin films by ellipsometry,” Thin Solid Films482(1-2), 126–132 (2005). [CrossRef]
  17. E. S. Kooij, H. Wormeester, E. A. M. Brouwer, E. van Vroonhoven, A. van Silfhout, and B. Poelsema, “Optical characterization of thin colloidal gold films by spectroscopic ellipsometry,” Langmuir18(11), 4401–4413 (2002). [CrossRef]
  18. C. Q. Sun, “Size dependence of nanostructures: Impact of bond order deficiency,” Prog. Solid State Chem.35(1), 1–159 (2007). [CrossRef]
  19. B. X. Xu, Z. H. Cen, Y. T. Toh, J. M. Li, K. D. Ye, and J. Zhang, “Efficiency analysis of near field optical transducer used in heat-assisted magnetic recording,” IEEE Trans. Magn. (to be published).

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