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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 15 — Jul. 28, 2014
  • pp: 18715–18723

Resolving near-field from high order signals of scattering near-field scanning optical microscopy

Nan Zhou, Yan Li, and Xianfan Xu  »View Author Affiliations


Optics Express, Vol. 22, Issue 15, pp. 18715-18723 (2014)
http://dx.doi.org/10.1364/OE.22.018715


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Abstract

The ability of using scattering-type near-field scanning optical microscopy (s-NSOM) to characterize amplitude and phase of optical near fields was investigated. We employ numerical simulations to compute signals scattered by the tip, using a bowtie nano-aperture as the example, and compare with the data obtained from s-NSOM measurements. Through demodulation of higher order harmonic signals, we show that, with the increasing order of harmonic signals, both the simulated and measured near fields are in closer agreement with the anticipated near field results. The polarization-resolved detection also helps to establish a tip-dependent transfer matrix that relates the local field components with the s-NSOM signals, which characterizes the scattering of the tip with respect to different field components. This work illustrates the importance of using higher order signals in obtaining near field in an s-NSOM measurement.

© 2014 Optical Society of America

OCIS Codes
(180.4243) Microscopy : Near-field microscopy
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Microscopy

History
Original Manuscript: June 11, 2014
Revised Manuscript: July 15, 2014
Manuscript Accepted: July 18, 2014
Published: July 25, 2014

Virtual Issues
Vol. 9, Iss. 9 Virtual Journal for Biomedical Optics

Citation
Nan Zhou, Yan Li, and Xianfan Xu, "Resolving near-field from high order signals of scattering near-field scanning optical microscopy," Opt. Express 22, 18715-18723 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-15-18715


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