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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 1, Iss. 11 — Nov. 24, 1997
  • pp: 332–337

Multiple wavelength heterodyne array interferometry

Lenore McMackin, David G. Voelz, and Matthew P. Fetrow  »View Author Affiliations

Optics Express, Vol. 1, Issue 11, pp. 332-337 (1997)

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Multiple wavelength interferometry is combined with a heterodyne array sensing technique to provide an approach for measuring highly aberrated optical surfaces. Interferometric measurements created with long effective wavelengths are obtained by digitally combining complex exposures collected at different optical wavelengths. The heterodyne array sensing method is straightforward to implement and holds promise for rapid wavefront measurements with high spatial and phase resolution. Measurements of a tilted, flat surface are presented and analyzed.

© Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Focus Issue: Signal collection and recovery

Original Manuscript: September 2, 1997
Published: November 24, 1997

Lenore McMackin, David Voelz, and Matthew Fetrow, "Multiple Wavelength Heterodyne Array Interferometry," Opt. Express 1, 332-337 (1997)

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