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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 10, Iss. 20 — Oct. 7, 2002
  • pp: 1099–1104

Novel method for ultrashort laser pulse-width measurement based on the self-diffraction effect

Peng Xi, Changhe Zhou, Enwen Dai, and Liren Liu  »View Author Affiliations


Optics Express, Vol. 10, Issue 20, pp. 1099-1104 (2002)
http://dx.doi.org/10.1364/OE.10.001099


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Abstract

Previous pulse-width measurement methods for ultrashort laser pulses have broadly employed nonlinear effects; thus any of these previous methods may experience problems relating to nonlinear effects. Here we present a new pulse-width measuring method based on the linear self-diffraction effect. Because the Talbot effect of a grating with ultrashort laser pulse illumination is different from that with continuous laser illumination, we are able to use this difference to obtain information about the pulse width. Three new techniques—the intensity integral technique, the intensity comparing ratio technique, and the two-dimensional structure technique— are introduced to make this method applicable. The method benefits from the simple structure of the Talbot effect and offers the possibility to extend the measurement of infrared and x-ray waves, for which currently used nonlinear methods do not work.

© 2002 Optical Society of America

OCIS Codes
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Research Papers

History
Original Manuscript: August 30, 2002
Revised Manuscript: September 23, 2002
Published: October 7, 2002

Citation
Peng Xi, Changhe Zhou, Enwen Dai, and Liren Liu, "Novel method for ultrashort laser pulse-width measurement based on self-diffraction effect," Opt. Express 10, 1099-1104 (2002)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-10-20-1099


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References

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