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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 10, Iss. 20 — Oct. 7, 2002
  • pp: 1111–1117

Diffracting aperture based differential phase contrast for scanning X-ray microscopy

Burkhard Kaulich, Francois Polack, Ulrich Neuhaeusler, Jean Susini, Enzo di Fabrizio, and Thomas Wilhein  »View Author Affiliations

Optics Express, Vol. 10, Issue 20, pp. 1111-1117 (2002)

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It is demonstrated that in a zone plate based scanning X-ray microscope, used to image low absorbing, heterogeneous matter at a mesoscopic scale, differential phase contrast (DPC) can be implemented without adding any additional optical component to the normal scheme of the microscope. The DPC mode is simply generated by an appropriate positioning and alignment of microscope apertures. Diffraction from the apertures produces a wave front with a non-uniform intensity. The signal recorded by a pinhole photo diode located in the intensity gradient is highly sensitive to phase changes introduced by the specimen to be recorded. The feasibility of this novel DPC technique was proven with the scanning X-ray microscope at the ID21 beamline of the European Synchrotron Radiation facility (ESRF) operated at 6 keV photon energy. We observe a differential phase contrast, similar to Nomarski’s differential interference contrast for the light microscope, which results in a tremendous increase in image contrast of up to 20 % when imaging low absorbing specimen.

© 2002 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(180.7460) Microscopy : X-ray microscopy
(340.6720) X-ray optics : Synchrotron radiation

ToC Category:
Research Papers

Original Manuscript: August 9, 2002
Revised Manuscript: September 24, 2002
Published: October 7, 2002

Burkhard Kaulich, Francois Polack, Ulrich Neuhaeusler, Jean Susini, Enzo di Fabrizio, and Thomas Wilhein, "Diffracting aperture based differential phase contrast for scanning X-ray microscopy," Opt. Express 10, 1111-1117 (2002)

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