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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 14 — Jul. 14, 2003
  • pp: 1598–1606

Direct observation of second-harmonic generation from crystalline particles in Ge-doped SiO2 glass films

T. Fujiwara, T. Sawada, Y. Benino, T. Komatsu, M. Takahashi, T. Yoko, and J. Nishii  »View Author Affiliations

Optics Express, Vol. 11, Issue 14, pp. 1598-1606 (2003)

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The authors report what is, to our best knowledge, the first observation of second-harmonic generation (SHG) directly from the crystalline particles in Ge-doped SiO2 (Ge:SiO2) glass films. Ge:SiO2 glass films with approximately 5 µm thickness were fabricated by chemical vapor-phase deposition. X-ray diffraction (XRD) peaks at around 2θ=22° in thermally crystallized Ge:SiO2 films were observed, and obtained XRD patterns are exactly the same as those in ultraviolet-laser-poled Ge:SiO2 glasses. Using SHG microscopic technique with a Nd:YAG laser, it has been successfully found that SH emitting with 532 nm wavelength is observed directly from the crystalline particles induced in the crystallized films.

© 2003 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(190.4400) Nonlinear optics : Nonlinear optics, materials

ToC Category:
Research Papers

Original Manuscript: April 30, 2003
Revised Manuscript: June 4, 2003
Published: July 14, 2003

T. Fujiwara, T. Sawada, Y. Benino, T. Komatsu, M. Takahashi, T. Yoko, and J. Nishii, "Direct observation of second-harmonic generation from crystalline particles in Ge-doped SiO2 glass films," Opt. Express 11, 1598-1606 (2003)

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