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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 17 — Aug. 25, 2003
  • pp: 1966–1979

Dependence of mode characteristics on the central defect in elliptical hole photonic crystal fibers

Wang Zhi, Ren Guobin, Lou Shuqin, and Jian Shuisheng  »View Author Affiliations


Optics Express, Vol. 11, Issue 17, pp. 1966-1979 (2003)
http://dx.doi.org/10.1364/OE.11.001966


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Abstract

Some mode characteristics are obtained by the full vector supercell overlap method that has been developed to model triangular lattice elliptical hole photonic crystal fibers regardless of whether the light is guided by total internal reflection or a photonic bandgap mechanism. When the central defect hole is large enough, the modes are disordered. Birefringence (Δn) dependence on the central defect is discussed in detail by numerical analysis.

© 2003 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(350.3950) Other areas of optics : Micro-optics

ToC Category:
Research Papers

History
Original Manuscript: June 20, 2003
Revised Manuscript: August 8, 2003
Published: August 25, 2003

Citation
Wang Zhi, Ren Guobin, Lou Shuqin, and Jian Shuisheng, "Dependence of mode characteristics on the central defect in elliptical hole photonic crystal fibers," Opt. Express 11, 1966-1979 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-17-1966


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