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Optics Express

Optics Express

  • Editor: Michael Duncan
  • Vol. 11, Iss. 19 — Sep. 22, 2003
  • pp: 2289–2302

X-ray phase-contrast microscopy and microtomography

S.C. Mayo, T.J. Davis, T.E. Gureyev, P.R. Miller, D. Paganin, A. Pogany, A.W. Stevenson, and S.W. Wilkins  »View Author Affiliations


Optics Express, Vol. 11, Issue 19, pp. 2289-2302 (2003)
http://dx.doi.org/10.1364/OE.11.002289


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Abstract

In-line phase contrast enables weakly absorbing specimens to be imaged successfully with x-rays, and greatly enhances the visibility of fine scale structure in more strongly absorbing specimens. This type of phase contrast requires a spatially coherent beam, a condition that can be met by a microfocus x-ray source. We have developed an x-ray microscope, based on such a source, which is capable of high resolution phase-contrast imaging and tomography. Phase retrieval enables quantitative information to be recovered from phase-contrast microscope images of homogeneous samples of known composition and density, and improves the quality of tomographic reconstructions.

© 2003 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(340.7460) X-ray optics : X-ray microscopy

ToC Category:
Focus Issue: Coherent x-ray optics

History
Original Manuscript: July 24, 2003
Revised Manuscript: September 10, 2003
Published: September 22, 2003

Citation
S. Mayo, T. Davis, T. Gureyev, P. Miller, D. Paganin, A. Pogany, A. Stevenson, and S. Wilkins, "X-ray phase-contrast microscopy and microtomography," Opt. Express 11, 2289-2302 (2003)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-11-19-2289


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